The impact of Miller and coupling effects on single event transient in logical circuits
暂无分享,去创建一个
Peng Bai | Li Cai | Weidong Peng | Baojun Liu | Xiaokuo Yang | Hongtu Huang
[1] Farshad Firouzi,et al. An accurate model for soft error rate estimation considering dynamic voltage and frequency scaling effects , 2011, Microelectron. Reliab..
[2] Denis Flandre,et al. Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs , 2010, Microelectron. Reliab..
[3] M. L. Alles,et al. Radiation effects in new materials for nano-devices , 2011 .
[4] Chih-Peng Fan,et al. Efficient RC low-power bus encoding methods for crosstalk reduction , 2011, Integr..
[5] Zhi Yang,et al. Interconnect crosstalk noise evaluation in deep-submicron technologies , 2009, Microelectron. Reliab..
[6] Fernanda Gusmão de Lima Kastensmidt,et al. Modeling the sensitivity of CMOS circuits to radiation induced single event transients , 2008, Microelectron. Reliab..
[7] P.H. Eaton,et al. Digital Single Event Transient Trends With Technology Node Scaling , 2006, IEEE Transactions on Nuclear Science.
[8] Ming Zhang,et al. Logic soft errors in sub-65nm technologies design and CAD challenges , 2005, Proceedings. 42nd Design Automation Conference, 2005..
[9] Mehdi Baradaran Tahoori,et al. Soft error modeling and remediation techniques in ASIC designs , 2010, Microelectron. J..
[10] Wang Yu,et al. Soft error generation analysis in combinational logic circuits , 2010 .
[11] F. Wrobel,et al. Criterion for SEU occurrence in SRAM deduced from circuit and device Simulations in case of neutron-induced SER , 2005, IEEE Transactions on Nuclear Science.
[12] Selahattin Sayil,et al. Single Event crosstalk shielding for CMOS logic , 2009, Microelectron. J..
[13] B. Narasimham,et al. The Effect of Negative Feedback on Single Event Transient Propagation in Digital Circuits , 2006, IEEE Transactions on Nuclear Science.