Depolarization effect in reflection-mode tip-enhanced Raman scattering for Raman active crystals

Reflection-mode tip-enhanced Raman scattering (TERS) has the advantage to characterize any sample, particularly opaque, bulk, and multilayered samples. However, the background signal in reflection-mode TERS is huge due to large focus spots associated with an objective lens that has a long working distance. Moreover, for a multilayered and bulk sample, the Raman signal from the bulk layer interferes with the Raman signal on a thin surface layer. This unwanted bulk background signal reduces the sensitivity of the measurement and makes it difficult to get a high-contrast TERS image in the reflection mode. Here, we demonstrate two techniques to suppress the far-field Raman signals coming from the focus area and bulk silicon germanium substrate. First, we reduce the far-field signal by controlling the polarization state of the incident and scattered Raman as well as manipulating the well-defined polarization of a crystalline sample, which strongly depends on the polarization and propagation of the incident lig...

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