Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors
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Nowab Reza M. D. Ashif | D. Linten | Shih-Hung Chen | Marko Simicic | G. Hellings | K. Myny | A. Kronemeijer | M. Nag
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Nowab Reza M. D. Ashif | D. Linten | Shih-Hung Chen | Marko Simicic | G. Hellings | K. Myny | A. Kronemeijer | M. Nag