Embedding Defect and Traceability Information in CIM-and PIM-Level Software Models

Additional information about software models comes in different forms such as defects detected, design patterns used, traceability information to other abstraction levels, etc. In this paper, we present how additional information about defects, context, traceability, etc. can be embedded into UMLand BPMN-based PIMand CIM-level software models. Furthermore, we present a tool that uses the information about quality defects within a PIM to visualize defects directly in the diagrams of a software model.