Access Transistor Design and Optimization for 65/45nm High Performance SOI eDRAM

A 65 nm prototype embedded DRAM macro on partially depleted SOI (PD-SOI) substrate capable of <2. 0ns latency and the enabling cell technology have been described previously [1,2]. In this paper, we focus on the cell design and optimization for best retention and performance which have been extended to the 45 nm node.

[1]  Takaho Tanigawa,et al.  Device Technology for embedded DRAM utilizing stacked MIM(Metal-Insulator-Metal) Capacitor , 2006, IEEE Custom Integrated Circuits Conference 2006.