A DNA-based computing method for solving control chart pattern recognition problems

Abstract DNA-based computing (DBC) is one of the promising nature-inspired computing paradigms. In this paper, a new DBC method is developed for solving complex engineering problems by using silicon-based computing machines. The proposed DBC method is applied to solve a stochastic pattern recognition problem (i.e., distinguishing a normal pattern from an abnormal pattern exhibited by few data points in a control chart for statistical process control). The performance of the proposed DBC method is demonstrated and the future direction of research is highlighted.

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