An Overview of Test Synthesis Tools

The two types of tools now commercially available implement the basic elements of first synthesis differently. Selecting among various gate- and RT-level tools requires a careful evaluation considering issues like desired circuit quality, methodology circuit area, and integration. >

[1]  LaNae J. Avra,et al.  ALLOCATION AND ASSIGNMENT IN HIGH-LEVEL SYNTHESIS FOR SELF-TESTABLE DATA PATHS , 1991, 1991, Proceedings. International Test Conference.

[2]  Peter C. Maxwell,et al.  The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need? , 1992, ITC.

[3]  H. Cox.  On synthesizing circuits with implicit testability constraints , 1994, Proceedings., International Test Conference.

[4]  R. G. Bennitts.  Progress in design for test: a personal view , 1994, IEEE Design & Test of Computers.

[5]  Alberto L. Sangiovanni-Vincentelli,et al.  Synthesis and optimization procedures for fully and easily testable sequential machines , 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

[6]  Christos A. Papachristou,et al.  A design for testability scheme with applications to data path synthesis , 1991, 28th ACM/IEEE Design Automation Conference.

[7]  Robert C. Aitken,et al.  The effect on quality of non-uniform fault coverage and fault probability , 1994, Proceedings., International Test Conference.