论文信息 - In-Depth Investigation of the Carbon Microstructure of Silicon Carbide-Derived Carbons by Wide-Angle X-ray Scattering - 字舞流文

In-Depth Investigation of the Carbon Microstructure of Silicon Carbide-Derived Carbons by Wide-Angle X-ray Scattering

M. Oschatz | B. Smarsly | S. Kaskel | W. Nickel | Kristin Faber | F. Badaczewski | G. Mondin | Felix M Badaczewski