Innovation to overcome limitations of test equipment

In this contribution, we describe current developments in the automatic test equipment (ATE) industry with respect to the hardware and software. For testing mixed-signal interface devices, such as digital-to-analog and analog-to-digital converters (DACs and ADCs) the standard test setups are examined. In particular, limitations are identified that lead to exponentially increasing test time for high-resolution converters. Examples of innovative approaches to keep this test cost increase at bay are outlined.

[1]  Michael Peter Kennedy,et al.  Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs , 2005, J. Electron. Test..

[2]  Gordon W. Roberts,et al.  An Introduction to Mixed-Signal IC Test and Measurement , 2000 .

[3]  Solomon Max.  Testing high speed high accuracy analog to digital converters embedded in systems on a chip , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[4]  Michael Peter Kennedy,et al.  Linear model-based testing of ADC nonlinearities , 2004, IEEE Transactions on Circuits and Systems I: Regular Papers.

[5]  Timothy Daniel Lyons.  THE PRODUCTION IMPLEMENTATION OF A LINEAR ERROR MODELING TECHNIQUE , 1992, Proceedings International Test Conference 1992.

[6]  Michael Peter Kennedy,et al.  Linear model-based error identification and calibration for data converters , 2003, 2003 Design, Automation and Test in Europe Conference and Exhibition.

[7]  Gerard N. Stenbakken,et al.  : Modeling and Test Point Selection for Data Converter Testing , 1985, ITC.