论文信息 - Physical Models for Predicting the Effect of Atmospheric Corrosion on Microelectronic Reliability - 字舞流文

Physical Models for Predicting the Effect of Atmospheric Corrosion on Microelectronic Reliability

David G. Robinson | J. N. Sweet | K. L. Erickson | D. W. Peterson | Samuel J. Lucero | N. R. Sorensen | J. W. Braithwaite | J. R. Michael | C. C. Battaile

[1] G. Frankel,et al. Corrosion of Microelectronic and Magnetic Data-Storage Devices , 2002 .

[2] C. Glenn Shirley,et al. THB reliability models and life prediction for intermittently-powered nonhermetic components , 1994 .