Tight junction properties change during epidermis development
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P. Elias | K. Feingold | T. Mauro | A. Celli | Yan J. Jiang | D. Crumrine | Yongjiao Zhai
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P. Elias | K. Feingold | T. Mauro | A. Celli | Yan J. Jiang | D. Crumrine | Yongjiao Zhai