论文信息 - Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices - 字舞流文

Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices

M. Bidaud | Gérard Ghibaudo | C. Petit | O. Simonetti | M. Fadlallah | F. Guyader | A. Meinertzhagen | M. Fadlallah