Design of double-and triple-sampling X-bar control charts using genetic algorithms

As today’s manufacturing ®rms are moving towards agile manufacturing, quick and economic on-line statistical process control solutions are in high demand. Multiple sampling X-bar control charts are such an alternative. They can be designed to allow quick detection of a small shift in process mean and provide a quick response in an agile manufacturing environment. In this paper, the designs of double-sampling (DS) X-bar control charts are formulated and solved with a genetic algorithm. Based on the results in solving the DS chart design problems, triple sampling (TS) X-bar control charts are developed. The e ciency of the TS charts is compared with that of the DS charts. The results of the comparison show that TS charts are more e cient in terms of minimizing the average sample size.