Thickness measurement of multi-layered structures: a neural net approach
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In our laboratory we got some experience about the high frequency characterisation of heteregeneous and multilayered structures. Several tools have been developed for this purpose. Our aim is to apply a neural net approach to this problem. Suitable neural net structures are designed for performing this task. Simulated echograms are used as inputs in the learning phase and then in the operating one
[1] Richard P. Lippmann,et al. An introduction to computing with neural nets , 1987 .
[2] Z. Derouiche,et al. Study of high frequency echograms of heterogeneous media using deconvolution techniques , 1992 .