A Compact 600 GHz Electronically Tunable Vector Measurement System for Submillimeter Wave Imaging

A compact submillimeter wave transmission/reflection measurement system has been demonstrated at 560-635 GHz, with electronic tuning over the entire band. Maximum dynamic range measured at a single frequency is 90 dB (60 dB typical), and phase noise is less than +/- 2deg. By using a frequency steerable lens at the source output and mixer input, the frequency agility of the system can be used to scan the source and receive beams, resulting in near real-time imaging capability using only a single pixel