论文信息 - Theoretical basis for the statistics of dielectric breakdown

Theoretical basis for the statistics of dielectric breakdown

The statistics of dielectric breakdown processes are presented and compared with those derived from consideration of the fluctuation components of the dielectric response. It is shown that the Weibull statistic parameters have a direct physical meaning and that breakdown processes can be considered as cooperative events.

L. A. Dissado | L. Dissado | R. Hill | R M Hill

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