论文信息 - 4H-SiC JFET Multilayer Integrated Circuit Technologies Tested Up to 1000 K - 字舞流文

4H-SiC JFET Multilayer Integrated Circuit Technologies Tested Up to 1000 K

Liang-Yu Chen | Glenn M. Beheim | David J. Spry | Dorothy Lukco | P. G. Neudeck | P. Neudeck | G. Beheim | D. Lukco | Carl W. Chang | D. Spry | Liangyu Chen | Carl W. Chang