论文信息 - Atomic state and characterization of nitrogen at the SiC/SiO2 interface - 字舞流文

Atomic state and characterization of nitrogen at the SiC/SiO2 interface

L. Feldman | Wei-jie Lu | Y. Sharma | S. Pantelides | Can Xu | B. Tuttle | E. Garfunkel | John R. Williams | T. Gustafsson | Yi Xu | H. Lee | S. Shubeita | A. Ahyi | A. Wan | Xingguang Zhu | Sorrie Ceesay