Automated accurate high value resistances measurement in the range from 100 kΩ to 100 MΩ at NIS

Abstract This paper describes the procedures made at National Institute for Standards (NIS), Egypt to establish accurate resistance measurements for high value resistance standards in the range from 100 kΩ to 100 MΩ. Guarded Hamon transfer standards have been used at NIS for scaling to high resistance levels up to 100 MΩ. The used method at NIS for the high resistance measurements, above 100 kΩ, is the DMM-based method which works automatically. A full description of the used method and of the new software which is made especially for this purpose are reported. Also, the uncertainty for the measurement of the Hamon transfer standard used for the scaling process and the standard resistor under calibration are evaluated.