Frequency Switchable and Tunable Negative Group Delay Circuits based on Defected Microstrip Structures

|Group delay distortions are critical for high quality transmissions in today’s communication system. In this paper, we have proposed the design and analysis of defected microstrip line-based Negative Group Delay Circuits (NGDCs) to compensate for group delay distortions. Initially, a tunable pulse shaped defection based NGD structure is designed wherein a variable resistor connection allows group delay tunability. The proposed design is able to generate a group delay (GD) tuning from 0 to (cid:0) 4 : 8 ns at 2.7 GHz as the resistance is varied from 1 kΩ to 1 MΩ. Further, we embedded two stubs to implement the switchable multi-band feature on the proposed NGDC design. The NGDCs are fabricated, and the measured results con(cid:12)rm the proposed concept. Lastly, we designed a tunable compact NGDC with inverted-U stubs inscribed inside a microstrip line. It generated GD tunability at different frequency bands with the aid of a variable resistor and switched the frequencies as required. the measurements taken and depicts the operational frequencies achieved with this circuit at different states of S 1 and S 2 . The group delay tunability is also achieved by varying R ext from 1 kΩ to 1 MΩ for each value of S 1 and S 2 . Hence, these results con(cid:12)rm the frequency switchability and GD tunability achieved during simulations. The discrepancies between the measured and simulated data in centre frequencies and group delays could be primarily due to fabrication uncertainties. However, the measured results substantiate the novel ideas presented by the simulated results.

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