RTN in Scaled Transistors for On-Chip Random Seed Generation
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Yu Cao | Takashi Sato | Abinash Mohanty | Hiromitsu Awano | Ketul B. Sutaria | Yu Cao | Takashi Sato | K. Sutaria | H. Awano | Abinash Mohanty
[1] Nuditha Vibhavie Amarasinghe,et al. Complex random telegraph signals in 0.06 μm2 MDD n-MOSFETs , 2000 .
[2] Eddy Simoen,et al. (Invited) Random Telegraph Noise: From a Device Physicist's Dream to a Designer's Nightmare , 2011 .
[3] J. Alvin Connelly,et al. A noise-based IC random number generator for applications in cryptography , 2000 .
[4] Geoffrey E. Hinton,et al. ImageNet classification with deep convolutional neural networks , 2012, Commun. ACM.
[5] David Blaauw,et al. True Random Number Generator With a Metastability-Based Quality Control , 2007, IEEE Journal of Solid-State Circuits.
[6] K. P. Cheung,et al. On the magnitude of Random telegraph noise in ultra-scaled MOSFETs , 2011, 2011 IEEE International Conference on IC Design & Technology.
[7] R. Ohba,et al. Physical random number generator based on MOS structure after soft breakdown , 2004, IEEE Journal of Solid-State Circuits.
[8] Tibor Grasser,et al. Stochastic charge trapping in oxides: From random telegraph noise to bias temperature instabilities , 2012, Microelectron. Reliab..
[9] Yu Wang,et al. Modeling Random Telegraph Noise as a Randomness Source and its Application in True Random Number Generation , 2016, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
[10] D. Frank,et al. Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm , 2006, 2009 Symposium on VLSI Technology.
[11] J. A. Connelly,et al. A noise-based random bit generator IC for applications in cryptography , 1998, ISCAS '98. Proceedings of the 1998 IEEE International Symposium on Circuits and Systems (Cat. No.98CH36187).
[12] Kazutoshi Kobayashi,et al. Modeling of Random Telegraph Noise under circuit operation — Simulation and measurement of RTN-induced delay fluctuation , 2011, 2011 12th International Symposium on Quality Electronic Design.
[13] Pritish Narayanan,et al. Deep Learning with Limited Numerical Precision , 2015, ICML.
[14] Toshiro Hiramoto,et al. Impact of the device scaling on the low-frequency noise in n-MOSFETs , 2000 .
[15] Hiroyuki Ochi,et al. Multi-trap RTN parameter extraction based on Bayesian inference , 2013, International Symposium on Quality Electronic Design (ISQED).
[16] M. J. Kirton,et al. Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise , 1989 .
[17] Daibashish Gangopadhyay,et al. Compressed Sensing System Considerations for ECG and EMG Wireless Biosensors , 2012, IEEE Transactions on Biomedical Circuits and Systems.
[18] S. Chang,et al. Characterization of Oxide Traps in 28 nm n-Type Metal–Oxide–Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise , 2013 .
[19] R. Thewes,et al. A low-power true random number generator using random telegraph noise of single oxide-traps , 2006, 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers.
[20] Cor Claeys,et al. Hot-Carrier degradation of the Random Telegraph Signal amplitude in submicrometer Si MOSTs , 1993 .
[21] Andrew S. Cassidy,et al. A million spiking-neuron integrated circuit with a scalable communication network and interface , 2014, Science.
[22] Andrew S. Cassidy,et al. Real-Time Scalable Cortical Computing at 46 Giga-Synaptic OPS/Watt with ~100× Speedup in Time-to-Solution and ~100,000× Reduction in Energy-to-Solution , 2014, SC14: International Conference for High Performance Computing, Networking, Storage and Analysis.
[23] Alessandro Trifiletti,et al. A High-Speed Oscillator-Based Truly Random Number Source for Cryptographic Applications on a Smart Card IC , 2003, IEEE Trans. Computers.
[24] Yu Cao,et al. Energy-efficient reconstruction of compressively sensed bioelectrical signals with stochastic computing circuits , 2015, 2015 33rd IEEE International Conference on Computer Design (ICCD).
[25] L.W. Cheng,et al. The observation of trapping and detrapping effects in high-k gate dielectric MOSFETs by a new gate current Random Telegraph Noise (IG-RTN) approach , 2008, 2008 IEEE International Electron Devices Meeting.
[26] Paul C. Kocher,et al. The intel random number generator , 1999 .
[27] Nor Hisham Hamid,et al. Time-Domain Modeling of Low-Frequency Noise in Deep-Submicrometer MOSFET , 2008, IEEE Transactions on Circuits and Systems I: Regular Papers.
[28] R. Ohba,et al. Si nanodevices for random number generating circuits for cryptographic security , 2004, 2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519).