A new BIST scheme for 5GHz low noise amplifiers

This paper presents a new low-cost Built-In Self-Test (BIST) circuit for measuring gain, noise figure and input impedance of 5GHz low noise amplifier (LNA). The BIST circuit is designed using 0.18 µm SiGe technology. The test technique utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive.

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