HREM imaging conditions for stacking sequences in 18R martensite of Cu-Al alloys
暂无分享,去创建一个
G. Tendeloo | F. Lovey | D. Dyck | S. Amelinckx | W. Coene | J. Landuyt
[1] D. Dyck,et al. The real space method for dynamical electron diffraction calculations in high resolution electron microscopy. I: Principles of the method , 1984 .
[2] D. Dyck,et al. The real space method for dynamical electron diffraction calculations in high resolution electron microscopy: III. A computational algorithm for the electron propagation with its practical applications , 1984 .
[3] M. O'Keefe,et al. The high resolution electron microscopy of stacking defects in Cu–Zn–Al shape memory alloy , 1983 .
[4] Toshiaki Suzuki,et al. Forbidden Reflection Intensity in Electron Diffraction and Its Influence on the Crystal Structure Image , 1982 .
[5] D. Van Dyck,et al. Fast computational procedures for the simulation of structure images in complex or disordered crystals: a new approach , 1980 .
[6] S. Kajiwara,et al. Stacking Faults in the Martensite of Cu-Al Alloy , 1965 .
[7] J. Kakinoki,et al. Diffraction by a one-dimensionally disordered crystal. I. The intensity equation , 1965 .
[8] H. Warlimont,et al. The electron-metallography and crystallography of copper-aluminum martensites , 1963 .
[9] S. Kajiwara,et al. Electron Microscope Study of the Crystal Structure of the Martensite in a Copper-Aluminium Alloy , 1963 .