A robust penalty coupling of non-matching isogeometric Kirchhoff–Love shell patches in large deformations

Abstract Isogeometric Kirchhoff–Love elements have been receiving increasing attention in geometrically nonlinear analysis of thin shells because they make it possible to meet the C 1 requirement in the interior of surface patches and to avoid the use of finite rotations. However, engineering structures of appreciable complexity are typically modeled using multiple patches and, often, neither rotational continuity nor conforming discretization can be practically obtained at patch interfaces. Simple penalty approaches for coupling adjacent patches, applicable to either smooth or non-smooth interfaces and either matching or non-matching discretizations, have been proposed. Although the problem dependence of the penalty coefficient can be reduced by scaling factors which take into account geometrical and material parameters, only high values of the penalty coefficient can guarantee a negligible coupling error in all possible cases. However, this can lead to an ill conditioned problem and to an increasing iterative effort for solving the nonlinear discrete equations. In this work, we show how to avoid this drawback by rewriting the penalty terms in an Hellinger–Reissner form, introducing independent fields work-conjugated to the coupling equations. This technique avoids convergence problems, making the analysis robust also for very high values of the penalty coefficient, which can be then employed to avert coupling errors. Moreover, a proper choice of the basis functions for the new fields provides an accurate coupling also for general non-matching cases, preventing overconstrained solutions. The additional variables are condensed out and then not involved in the global system of equations to be solved. A highly efficient approach based on a mixed integration point strategy and an interface-wise reduced integration rule makes the condensation inexpensive preserving the sparsity of the condensed stiffness matrix and the coupling accuracy.