Determination of the third- and fifth-order nonlinear refractive indices in InN thin films

We have combined the reflection and transmission Z-scan (RZ- and TZ-scans) techniques under femtosecond laser at 800nm to extract both the third- and fifth-order nonlinear refractive indices (n2 and n4) in InN thin films. The observation of the nonlinear refractive index saturation in the intensity-dependent RZ-scan measurement indicates the existence of the fifth-order effect. By the aid of the TZ-scan, the fifth-order nonlinear effect has been enhanced by enlarging the cascaded contribution from the increased laser interaction length, where large n2 of −2.5×10−11cm2∕W and n4 of 2.1×10−19cm4∕W2 have been determined.We have combined the reflection and transmission Z-scan (RZ- and TZ-scans) techniques under femtosecond laser at 800nm to extract both the third- and fifth-order nonlinear refractive indices (n2 and n4) in InN thin films. The observation of the nonlinear refractive index saturation in the intensity-dependent RZ-scan measurement indicates the existence of the fifth-order effect. By the aid of the TZ-scan, the fifth-order nonlinear effect has been enhanced by enlarging the cascaded contribution from the increased laser interaction length, where large n2 of −2.5×10−11cm2∕W and n4 of 2.1×10−19cm4∕W2 have been determined.

[1]  P. Ebert,et al.  Style self-incompatibility gene products of Nicotlana alata are ribonucleases , 1989, Nature.

[2]  Jianguo Tian,et al.  Analysis of Z-scan of thick media with high-order nonlinearity by variational approach , 2003 .

[3]  M. Martinelli,et al.  Measurement of Refractive Nonlinearities in GaAs Above Bandgap Energy. , 2000, Applied optics.

[4]  M. Fakis,et al.  Z-scan analysis for high order nonlinearities through Gaussian decomposition , 2003 .

[5]  W. Shen,et al.  Temperature effects on optical properties of InN thin films , 2004 .

[6]  M. Larciprete,et al.  Measurement of pure Kerr nonlinearity in GaN thin films at 800 nm by means of eclipsing Z-scan experiments , 2007 .

[7]  Claire F. Gmachl,et al.  Resonant optical nonlinearities from intersubband transitions in GaN/AlN quantum wells , 2003 .

[8]  M. Fakis,et al.  Z-scan technique through beam radius measurements , 2003 .

[9]  Hui-Tian Wang,et al.  Theoretical study of saturable Kerr nonlinearity using top-hat beam Z-scan technique , 2006 .

[10]  L. Cury,et al.  Transverse self-phase modulation in ruby and GdAlO 3 :Cr +3 crystals , 1990 .

[11]  M. Becker,et al.  Ultrafast third-harmonic generation from textured aluminum nitride-sapphire interfaces , 2006 .

[12]  Ivan V. Tomov,et al.  Two-dimensional Z scan for arbitrary beam shape and sample thickness , 1999 .

[13]  W. Shen,et al.  Growth and depth dependence of visible luminescence in wurtzite InN epilayers , 2006 .

[14]  F. Wise,et al.  Measurement of fifth- and seventh-order nonlinearities of glasses , 2006 .

[15]  E. W. Stryland,et al.  Sensitive Measurement of Optical Nonlinearities Using a Single Beam Special 30th Anniversary Feature , 1990 .

[16]  Mansoor Sheik-Bahae,et al.  Determination of bound-electronic and free-carrier nonlinearities in ZnSe, GaAs, CdTe, and ZnTe , 1992 .

[17]  Peter Persephonis,et al.  Z-scan analysis for near-Gaussian beams through Hermite–Gaussian decomposition , 2003 .

[18]  Piotr Perlin,et al.  Picosecond Z-scan measurements on bulk GaN crystals , 2001 .

[19]  S. Saltiel,et al.  High-order nonlinear phase shift caused by cascaded third-order processes. , 1997, Optics letters.

[20]  C. Afonso,et al.  Limits to the determination of the nonlinear refractive index by the Z-scan method , 2002 .

[21]  A. I. Ryasnyanskiĭ.  Study of the nonlinear refractive index of chalcogenide films by the RZ-scan method , 2005 .

[22]  Kei Kaneko,et al.  Near-infrared intersubband absorption in GaN/AlN quantum wells grown by molecular beam epitaxy , 2002 .

[23]  W. Schaff,et al.  Optical bleaching effect in InN epitaxial layers , 2006 .

[24]  Ya-Xian Fan,et al.  Theory of Gaussian beam Z scan with simultaneous third- and fifth-order nonlinear refraction based on a Gaussian decomposition method , 2005 .

[25]  W. Shen,et al.  Direct evidence of Kerr-like nonlinearity by femtosecond Z-scan technique. , 2006, Optics express.

[26]  Ajoy K. Kar,et al.  Role of femtosecond pulses in distinguishing third- and fifth-order nonlinearity for semiconductor-doped glasses , 2001 .

[27]  Anderson S. L. Gomes,et al.  Reflection Z‐scan technique for measurements of optical properties of surfaces , 1994 .

[28]  M. Fakis,et al.  Z-scan technique for elliptic Gaussian beams , 2003 .

[29]  Umesh K. Mishra,et al.  Femtosecond Z-scan measurement of GaN , 1999 .

[30]  B. Taheri,et al.  Effects of beam ellipticity on Z-scan measurements , 1996 .