Study of V and Y Shape Frank-Type Stacking Faults Formation in 4H-SiC Epilayer
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Jie Zhang | M. Loboda | G. Chung | M. Dudley | B. Raghothamachar | Yu Yang | D. Hansen | Sha Yan Byrapa | S. Mueller | B. Thomas | E. Sanchez | F. Wu | Huanhuan Wang