Temperature dependent high-bias electrical properties of C60 microrods

We present the fabrication, characterization, and temperature dependent electrical properties of individual submicron-sized hexagonal rods of C60. These rods were synthesized by liquid-liquid interfacial precipitation methods and characterized by scanning electron and transmission electron microscopies and Raman spectroscopy. The microscopic analysis reveals highly developed crystalline order. Two-probe platinum-contacted devices were fabricated using long (∼30–50μm) individual C60 rods by focused ion beam assisted deposition on insulating (Si∕SiO2) substrates. Current-voltage (IV) measurements were performed on these devices in the temperature range of 18–300K under an applied voltage of −20to20V. Our measurements reveal an overall decrease in conductivity with decreasing temperature, with structures appearing commensurately with the known positions of the phase transitions. Cyclic high-bias measurements show substantial hysteretic behavior below T∼260K, expected from a sudden and large increase in the d...

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