论文信息 - Effect of Thermal Boundary Resistance of Metal/Dielectric Interface on Temperature Increase of Interconnects in Deeply Scaled VLSI. - 字舞流文

Effect of Thermal Boundary Resistance of Metal/Dielectric Interface on Temperature Increase of Interconnects in Deeply Scaled VLSI.

T. Matsukawa | Takanobu Watanabe | Yibin Xu | Yen‐Ju Wu | Zhicheng Jin | T. Matsuki | M. Tomita | H. Takezawa | T. Zhan | S. Ma | K. Mesaki | K. Oda