Investigation of Frequency Dependent Sensitivity of Noise Figure on Device Parameters in 65 nm CMOS
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Hyungcheol Shin | Hee-Sauk Jhon | Hakchul Jung | Minsuk Koo | Byung-Gook Park | Jong Duk Lee | Byung-Gook Park | Hyungcheol Shin | J. Lee | Hakchul Jung | M. Koo | Heesauk Jhon
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