论文信息 - Investigation of Frequency Dependent Sensitivity of Noise Figure on Device Parameters in 65 nm CMOS

Investigation of Frequency Dependent Sensitivity of Noise Figure on Device Parameters in 65 nm CMOS

We have investigated the noise sensitivity of low noise amplifier (LNA) at different frequency. This noise sensitivity analysis provides insights about noise parameters and it is very beneficial for making appropriate design trade-offs. From this work, the circuit designer can choose the adequate noise parameters tolerances.

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