A generalized equivalent temperature model in a time-varying environment
暂无分享,去创建一个
Li Sun | Pu Song | Yi Di | Xiao-Hui Gu
[1] Donghua Zhou,et al. Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process , 2012, IEEE Transactions on Reliability.
[2] I. E. T. Iben,et al. Head reliability of AMR sensors based on thermal stress tests , 2003, IBM J. Res. Dev..
[3] N. Balakrishnan,et al. Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process , 2012 .
[4] Vallayil N. A. Naikan,et al. Accelerated temperature and voltage life tests on aluminium electrolytic capacitors , 2016 .
[5] M. Tortorella,et al. Analysis of parameter-degradation data using life-data analysis programs , 1994, Proceedings of Annual Reliability and Maintainability Symposium (RAMS).
[6] Luis A. Escobar,et al. Accelerated degradation tests: modeling and analysis , 1998 .
[7] Jiaoying Huang,et al. Lifetime prediction for tantalum capacitors with multiple degradation measures and particle swarm optimization based grey model , 2012 .
[8] Jong-Wuu Wu,et al. Assessing the Lifetime Performance Index of Exponential Products With Step-Stress Accelerated Life-Testing Data , 2013, IEEE Transactions on Reliability.
[9] Hong-Fwu Yu,et al. Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate , 2006 .
[10] Kun Xiao,et al. Reliability Evaluation of the O-type Rubber Sealing Ring for Fuse Based on Constant Stress Accelerated Degradation Testing , 2014 .
[11] Mahesh D. Pandey,et al. A stochastic deterioration process for time-dependent reliability analysis , 2004 .
[12] Guangbin Yang,et al. Accelerated life tests at higher usage rates , 2005, IEEE Trans. Reliab..
[13] E. Takeda,et al. An empirical model for device degradation due to hot-carrier injection , 1983, IEEE Electron Device Letters.
[14] Zhaobin Wang,et al. Research on storage degradation testing and life prediction based on ARMA and wavelet transform model for aerospace electromagnetic relay , 2014, 2014 IEEE 60th Holm Conference on Electrical Contacts (Holm).
[16] C. Joseph Lu,et al. Using Degradation Measures to Estimate a Time-to-Failure Distribution , 1993 .
[17] Juin J. Liou,et al. A new extrapolation method for long-term degradation prediction of deep-submicron MOSFETs , 2003 .
[18] Hong-Fwu Yu,et al. Designing an accelerated degradation experiment by optimizing the estimation of the percentile , 2003 .
[19] Phil Purnell,et al. Interpretation of climatic temperature variations for accelerated ageing models , 2004 .
[20] William Q. Meeker,et al. A Review of Accelerated Test Models , 2006, 0708.0369.
[21] Guoqiang He,et al. Storage life of silicone rubber sealing ring used in solid rocket motor , 2014 .
[22] G. Salviati,et al. Degradation mechanisms and lifetime of state‐of‐the‐art green laser diodes , 2015 .
[23] M. Okada,et al. Accelerated test on electrochromic switchable mirror based on magnesium alloy thin film in simulated environment of various relative humidities , 2012 .
[24] N. V. Vakulov,et al. Estimation of in-use Guaranteed Rubber Lifetime test methods☆ , 2015 .
[25] Chen-Hua Wang,et al. New Nonisothermal Arrhenius Temperature Integral Approximate Formula , 2012 .