论文信息 - KFM detection of charges injected by AFM into a thin SiO2 layer containing Si nanocrystals - 字舞流文

KFM detection of charges injected by AFM into a thin SiO2 layer containing Si nanocrystals

L. Ressier | A. Arbouet | V. Paillard | S. Schamm | G. Benassayag | P. Normand | J. Grisolia | C. Dumas