Impact of Random Fabrication Errors on Fundamental Forward-Wave Small-Signal Gain and Bandwidth in Traveling-Wave Tubes With Finite-Space-Charge Electron Beams
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J. Booske | Y. Lau | C. Armstrong | T. Hargreaves | S. Sengele | M. Barsanti | Marc L. Barsanti | Member Ieee Sean Sengele | M. I. Thomas A. Hargreaves | F. I. Carter M. Armstrong | F. I. John H. Booske | F. I. Y. Y. Lau
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