Structure modelling and reciprocal space maps simulation of the (Ga,Al)N epitaxial layers deposited on the sapphire substrate
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[1] J. Serafińczuk,et al. X‐ray characterization of thick GaN layers grown by HVPE , 2005 .
[2] Pavlov,et al. Statistical dynamical theory of X-ray diffraction in the Bragg case: application to triple-crystal diffractometry , 2000, Acta crystallographica. Section A, Foundations of crystallography.
[3] J. Kuběna,et al. X‐ray double and triple crystal diffractometry of mosaic structure in heteroepitaxial layers , 1993 .
[4] B. Tanner,et al. X-ray and neutron dynamical diffraction : theory and applications , 1996 .