Multivariate prediction and background correction using local modeling and derivative spectroscopy

Two techniques based upon regression modeling of spectra are described for accurate estimation of the concentration of the analytes in the presence of background constituents. The results from two data sets are presented: 1) UV specta of biphenyl with naphthalene as a contaminant; and 2) X-ray diffractograms of kaolinite in samples contaminated with smectite

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