论文信息 - Critical thickness for the emergence of Weyl features in Co3Sn2S2 thin films - 字舞流文

Critical thickness for the emergence of Weyl features in Co3Sn2S2 thin films

K. Nomura | T. Seki | A. Tsukazaki | K. Fujiwara | K. Takanashi | J. Shiogai | J. Ikeda