On combining design for testability techniques
暂无分享,去创建一个
[1] F. P. Preparata,et al. Initializability Consideration in Sequential Machine Synthesis , 1992 .
[2] D. G. Saab,et al. Augmented partial reset , 1993, Proceedings of 1993 International Conference on Computer Aided Design (ICCAD).
[3] Irith Pomeranz,et al. On the Role of Hardware Reset in Synchronous Sequential Circuit Test Generation , 1994, IEEE Trans. Computers.
[4] David Bryan,et al. Combinational profiles of sequential benchmark circuits , 1989, IEEE International Symposium on Circuits and Systems,.
[5] Miron Abramovici,et al. A Cost-Based Approach to Partial Scan , 1993, 30th ACM/IEEE Design Automation Conference.
[6] Vishwani D. Agrawal,et al. Pascant: a partial scan and test generation system , 1991, Proceedings of the IEEE 1991 Custom Integrated Circuits Conference.
[7] J. R. Fox. Test-point Condensation in the Diagnosis of Digital Circuits , 1977 .
[8] Elizabeth M. Rudnick,et al. Non-Scan Design-for-Testability Techniques for Sequential Circuits , 1993, 30th ACM/IEEE Design Automation Conference.
[9] Eric Lindbloom,et al. Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test , 1983, IBM J. Res. Dev..
[10] Miron Abramovici,et al. WARNING: 100% Fault Coverage May Be Misleading!! , 1992, Proceedings International Test Conference 1992.
[11] Miron Abramovici,et al. Testability-based partial scan analysis , 1995, J. Electron. Test..
[12] Janak H. Patel,et al. A fault oriented partial scan design approach , 1991, 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers.
[13] S.M. Reddy,et al. On determining scan flip-flops in partial-scan designs , 1990, 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers.
[14] D. G. Saab,et al. Partial reset: An inexpensive design for testability approach , 1993, 1993 European Conference on Design Automation with the European Event in ASIC Design.
[15] Daniel G. Saab,et al. On selecting flip-flops for partial reset , 1993, Proceedings of IEEE International Test Conference - (ITC).
[16] J.H. Patel,et al. Probe point insertion for at-speed test , 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.
[17] Wu-Tung Cheng,et al. Gentest: an automatic test-generation system for sequential circuits , 1989, Computer.
[18] L. H. Goldstein,et al. SCOAP: Sandia Controllability/Observability Analysis Program , 1988, 17th Design Automation Conference.