A neural network characterization of a HEMT
暂无分享,去创建一个
We report a new approach to describe the bias-dependent behavior of a HEMT by using a neural network, whose inputs are gate-to-source (Vgs) and gate-to-drain bias voltages (Vds). Using a conventional small-signal equivalent circuit, we characterized the HEMT's S-parameters measured at various bias settings, and obtained the bias-dependent values of the equivalent circuit elements. Through experiments, we found that a 5-layered neural network (composed of 28 neurons) is adequate to represent 7 bias-dependent intrinsic elements simultaneously. A "well-trained" neural network shows excellent accuracy.
[1] R.A. Pucel,et al. GaAs FET device and circuit simulation in SPICE , 1987, IEEE Transactions on Electron Devices.
[2] John W. Bandler,et al. Analytically unified DC/small-signal/large-signal circuit design , 1991 .
[3] David E. Root,et al. Technology Independent Large Signal Non Quasi-Static FET Models by Direct Construction from Automatically Characterized Device Data , 1991, 1991 21st European Microwave Conference.
[4] Anders Krogh,et al. Introduction to the theory of neural computation , 1994, The advanced book program.