A Universal Test Fixture For Characterizing MM-Wave Solid State Devices Using A Novel Deembedding Procedure

The design and evaluation of a novel fixturing technique for characterizing mm-wave solid state devices, including monolithic microwave integrated circuits, is presented. The technique utilizes a cosine tapered ridge guide fixture and a one-tier deembedding procedure to provide accurate and repeatable device level data. Advanced features include "nondestructive" testing, full waveguide bandwidth operation, a high degree of universalism, and rapid yet repeatable chip-level characterization. Furthermore, only one set of calibration standards is required regardless of device geometry.