A four point-probe cell for resistivity measurement at high temperature

A four point-probe cell for measuring electrical resistivity of semiconducting compounds, particularly oxides at high temperature has been fabricated based on the theories of Uhlir (1955) and Smits (1958). Platinum-40% rhodium pins mounted on a stabilized zirconia block serve as the probe assembly. Using the cell for DC measurements, resistivities from 0.1-106 Omega cm can be conveniently measured against temperature with an accuracy of 3-0.5% depending on the order of magnitude of the resistivity to be measured. The data obtained are found to be highly reproducible.