论文信息 - Study of 50 GeV proton ionization loss by semiconductor detector with smoothly tunable thickness - 字舞流文

Study of 50 GeV proton ionization loss by semiconductor detector with smoothly tunable thickness

V. Maisheev | A. Kubankin | G. Britvich | Y. Chesnokov | A. Durum | M. Kostin | A. Yanovich | N. Shul'ga | A. V. Shchagin | S. Trofymenko | R. Nazhmudinov

[1] A. Kubankin,et al. Semiconductor detector with smoothly tunable effective thickness for the study of ionization loss by moderately relativistic electrons , 2016 .

[2] N. Shul'ga,et al. Ionization energy losses of relativistic electron in boundary layer of substance , 2013 .

[3] Daniele Passeri,et al. Energy loss measurement for charged particles in very thin silicon layers , 2011 .

[4] H. D. Thomsen,et al. Restricted energy loss of ultrarelativistic particles in thin targets – A search for deviations from constancy , 2010 .

[5] H. D. Thomsen,et al. Direct measurement of the Chudakov effect. , 2008, Physical review letters.

[6] Hans Bichsel,et al. Straggling in thin silicon detectors , 1988 .

[7] H. Bichsel,et al. Comparison of calculational methods for straggling in thin absorbers , 1975 .

[8] P. Siffert,et al. Large Departures From Landau Distributions for High-energy Particles Traversing Thin Si and Ge Targets , 1987 .