Characterization and Mitigation of Single-Event Transients in Xilinx 45-nm SRAM-Based FPGA

This paper presents a new approach for analyzing the effect of single-event transient (SET) in SRAM-based field-programmable gate array (FPGA) devices, which are widely used in the space environment. New SET characterizing and mitigation techniques, including continuous monitoring and controlling of the test, are proposed to ensure proper operation of the device under test. This is vital for verifying the proper functioning of the design and performing online reconfiguration if required, since the effect of a single-event upset (SEU) on the device configuration bits may disrupt the SET detection and mitigation design. While many studies focus on SEU, latch-up, and cumulative radiation [total ionizing dose (TID)] effects on SRAM-based FPGAs, only a few published works refer to the SET effect. Moreover, in contrast to previous SET studies, this paper presents a quantitative assessment for SET probability under the real radiation environment and provides cross-sectional analysis for both SET and SEU effects at low linear energy transfers (LETs) (up to 0.925 MeV $\cdot$ cm2/mg). The SET experiments have been carried out at UCL Cyclotron (Belgium) accelerator using heavy ions and under alpha source irradiation. Experimental results indicate that SET examinations on SRAM-based FPGAs should be performed only at low LETs due to the high SEU rate compared to the SET rate. Several kinds of filters have been implemented and proposed for SET mitigation demonstrating a significant reduction of the SET transient effects. The proposed methodology may provide a basic model for future research studies on SET radiation effects on SRAM-based FPGAs, and assisting in selecting an immune FPGA-based platform for satellites applications.

[1]  S. Gerardin,et al.  On the Static Cross Section of SRAM-Based FPGAs , 2008, 2008 IEEE Radiation Effects Data Workshop.

[2]  Gary Swift,et al.  Single-Event Characterization of the 28 nm Xilinx Kintex-7 Field-Programmable Gate Array under Heavy Ion Irradiation , 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

[3]  K. Kruckmeyer,et al.  Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter , 2009, IEEE Transactions on Nuclear Science.

[4]  J. K. Wang,et al.  Electron-Induced Single-Event Upsets in Static Random Access Memory , 2013, IEEE Transactions on Nuclear Science.

[5]  Tom Fairbanks,et al.  High-performance computing for airborne applications , 2010 .

[6]  Valeri Kirischian,et al.  Single Event Upset Characterization of the Cyclone V Field Programmable Gate Array Using Proton Irradiation , 2006, 2019 IEEE Radiation Effects Data Workshop.

[7]  C. Leroy,et al.  Astroparticle, Particle and Space Physics, Detectors and Medical Physics Applications , 2004 .

[8]  P. Eaton,et al.  Variation of digital SET pulse widths and the implications for single event hardening of advanced CMOS processes , 2005, IEEE Transactions on Nuclear Science.

[9]  G. R. Srinivasan.  Modeling the cosmic-ray-induced soft-error rate in integrated circuits: An overview , 1996, IBM J. Res. Dev..

[10]  N. Chatry,et al.  Experimental Characterization and Simulation of Electron-Induced SEU in 45-nm CMOS Technology , 2014, IEEE Transactions on Nuclear Science.

[11]  C. Carmichael,et al.  Single Event Upsets in Xilinx Virtex-4 FPGA Devices , 2006, 2006 IEEE Radiation Effects Data Workshop.

[12]  P. Graham,et al.  Radiation-induced multi-bit upsets in SRAM-based FPGAs , 2005, IEEE Transactions on Nuclear Science.

[13]  Mehran Amrbar,et al.  Heavy Ion Single Event Effects Measurements of Xilinx Zynq-7000 FPGA , 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

[14]  John McCollum,et al.  SET characterization and mitigation in RTAX-S antifuse FPGAs , 2009, 2009 IEEE Aerospace conference.

[15]  Ken LaBel,et al.  Testing Guidelines for Single Event Transient (SET) Testing of Linear Devices , 2003 .

[16]  Nadia Rezzak,et al.  SET and SEFI Characterization of the 65 nm SmartFusion2 Flash-Based FPGA under Heavy Ion Irradiation , 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

[17]  Adam R. Duncan,et al.  Electron-Induced Single-Event Upsets in 45-nm and 28-nm Bulk CMOS SRAM-Based FPGAs Operating at Nominal Voltage , 2015, IEEE Transactions on Nuclear Science.

[18]  B.L. Bhuva,et al.  RHBD techniques for mitigating effects of single-event hits using guard-gates , 2005, IEEE Transactions on Nuclear Science.

[19]  P. Dodd,et al.  Production and propagation of single-event transients in high-speed digital logic ICs , 2004, IEEE Transactions on Nuclear Science.

[20]  Yu Peng,et al.  SRAM FPGAs single event upsets detection method based on selective readback , 2017, Prognostics and System Health Management Conference.

[21]  P. C. Adell,et al.  Analysis of single-event transients in analog circuits , 2000 .

[22]  S. Gerardin,et al.  Methodologies to Study Frequency-Dependent Single Event Effects Sensitivity in Flash-Based FPGAs , 2009, IEEE Transactions on Nuclear Science.

[23]  Huaguo Liang,et al.  A Methodology for Characterization of SET Propagation in SRAM-Based FPGAs , 2016, IEEE Transactions on Nuclear Science.

[24]  G Allen,et al.  Assessing and mitigating radiation effects in Xilinx SRAM FPGAs , 2008, 2008 European Conference on Radiation and Its Effects on Components and Systems.

[25]  T. Ohshima,et al.  LET Dependence of Single Event Transient Pulse-Widths in SOI Logic Cell , 2009, IEEE Transactions on Nuclear Science.

[26]  B. Narasimham,et al.  Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies , 2007, IEEE Transactions on Nuclear Science.

[27]  R.D. Schrimpf,et al.  Single event transient pulse widths in digital microcircuits , 2004, IEEE Transactions on Nuclear Science.

[28]  B. Narasimham,et al.  On-Chip Characterization of Single-Event Transient Pulsewidths , 2006, IEEE Transactions on Device and Materials Reliability.

[29]  Huaguo Liang,et al.  A single event transient detector in SRAM-based FPGAs , 2017, IEICE Electron. Express.

[30]  N. J. Buchanan,et al.  Total ionizing dose effects in a SRAM-based FPGA , 1999, 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463).

[31]  Fabian Vargas,et al.  Analysis of single-event upsets in a Microsemi ProAsic3E FPGA , 2017, 2017 18th IEEE Latin American Test Symposium (LATS).