Improved gate replacement technique for mitigating circuit NBTI effect
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Zhang Yao | Huang Zhengfeng | Liu Xiaohong | Yi Maoxiang | Cheng Long | Zhu Jiong | Hu Lincong | L. Xiaohong | Zhu Jiong | Huang Zhengfeng | Yi Maoxiang | Zhang Yao | Hu Lincong | Cheng Long