SIFER: Scale-Invariant Feature Detector with Error Resilience
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Rudy Lauwereins | Luc Van Gool | Gauthier Lafruit | Pradip Mainali | Qiong Yang | Bert Geelen | L. Gool | G. Lafruit | R. Lauwereins | Pradip Mainali | B. Geelen | Qiong Yang
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