SELF-TIMED is SELF-DIAGNOSTIC
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In [DGY88a] and [DGY88b] we have shown an efficient method for the synthesis of self-timed combinational circuits and self-timed finite state machines which may serve as building blocks for the design of complex self-timed systems (see e.g. [DGY89]). In this paper we have shown that combinational logic building blocks are self-diagnostic with respect to the single-stuck-at fault model. It can be shown that complex self-timed systems composed of these and similar building blocks (e.g. the FIFO element described in [Da89]) are also self-diagnostic.
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