论文信息 - Soft fault test and diagnosis for analog circuits

Soft fault test and diagnosis for analog circuits

A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and a numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issues and multifault diagnosis are also discussed in this paper.

Peng Wang | Shiyuan Yang

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