Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme

This paper provides development of an RF circuit software tool that automatically generates diagnostic programs for device interface boards. The diagnostic tool utilizes novel techniques to differentiate faulty RF circuits embedded in printed circuit boards. We present RF circuit diagnostic techniques using power sensors and multi-tone dither testing, which we integrated into the diagnostic software tool that we developed. The diagnostic tool provides user-transparent pseudocodes with high fault coverage and significantly decreases time to market.

[1]  Bruce C. Kim,et al.  RADPro: Automatic RF analyzer and diagnostic program generation tool , 2010, 2010 IEEE International Test Conference.

[2]  R. de Carlo,et al.  Analog multifrequency fault diagnosis , 1983 .

[3]  Ira Krepchin,et al.  Texas Instruments Inc. , 1963, Nature.

[4]  Abhijit Chatterjee,et al.  Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers , 2005, European Test Symposium (ETS'05).

[5]  Abhijit Chatterjee,et al.  Test generation based diagnosis of device parameters for analog circuits , 2001, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001.

[6]  Abhijit Chatterjee,et al.  Fault diagnosis for mixed-signal electronic systems , 1999, 1999 IEEE Aerospace Conference. Proceedings (Cat. No.99TH8403).

[7]  T. M. Souders,et al.  Time domain testing strategies and fault diagnosis for analog systems , 1989, 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference.

[8]  Felipe Toledo,et al.  Low cost automatic mixed-signal board test using IEEE 1149.4 , 2007, 2007 IEEE International Test Conference.

[9]  Salvador Mir,et al.  Fault diagnosis of analog circuits based on machine learning , 2010, 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010).

[10]  D.C.L. van Geest,et al.  On-chip mixed-signal test structures re-used for board test , 2004 .

[11]  John Vanderkooy,et al.  Quantization and Dither: A Theoretical Survey , 1992 .

[12]  R. E. Tulloss,et al.  BIST and boundary-scan for board level test: test program pseudocode , 1989, [1989] Proceedings of the 1st European Test Conference.

[13]  Bruce C. Kim,et al.  Automatic diagnostic program generation for mixed signal load board , 2003, International Test Conference, 2003. Proceedings. ITC 2003..

[14]  C. Narduzzi,et al.  Dither signal effects on the resolution of nonlinear quantizers , 1993, 1993 IEEE Instrumentation and Measurement Technology Conference.

[15]  O. C. Woodard.  High density interconnect verification of unpopulated multichip modules , 1991, [1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium.

[16]  Neeraj Sen,et al.  Fault diagnosis for linear systems via multifrequency measurements , 1979 .

[17]  Dario Petri,et al.  Effect of additive dither on the resolution of ideal quantizers , 1994 .

[18]  Mathias Friese,et al.  Multitone signals with low crest factor , 1997, IEEE Trans. Commun..

[19]  Bruce C. Kim,et al.  DIBPro: Automatic Diagnostic Program Generation Tool , 2006, 2006 IEEE International Test Conference.