Relationship between the photoluminescence and conductivity of undoped ZnO thin films grown with various oxygen pressures

Abstract The pulsed laser deposition (PLD) technique is used to deposit undoped ZnO thin films on glass substrates at 150 °C with different oxygen pressures of 40, 80, 100 and 150 mTorr. X-ray diffraction (XRD) and atomic force microscopy (AFM) studies indicated that the obtained ZnO thin films were hexagonal wurtzite-type structures with strong (0 0 2) c-axis orientation. The relationship between photoluminescence and the conductivity of the ZnO thin films grown by pulsed laser deposition at various oxygen pressures was also discussed. The intensity of the deep-level-emission (DLE) and conductivity generally increased as the oxygen pressure decreased. The intensity of DLE peak was generally proportional to the conductivity. The band gap energy values, determined from transmittance spectra, were around 3.30–3.34 eV, and decreased when the oxygen pressure increased.

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