EMI measurements for aging control and fault diagnosis in active devices

This work presents and discusses the results of a measurement campaign aimed at demonstrating the effects of aging and faults on the spectrum produced by an electronic device. The evaluations evidence a high spectrum sensibility to the mentioned events, and suggest a methodology for apparatus monitoring, which is particularly useful in connection with critical devices, in order to decide whether to activate their stand-by units and/or to decide whether to replace or to service them. The results obtained support the theoretic feasibility of the method, whereas the practical one requires further investigations.