Al0.30Ga0.70N/GaN/Al0.07Ga0.93N Double Heterostructure High Electron Mobility Transistors with a Record Saturation Drain Current of 1050mA/mm*
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Y. Hao | Jincheng Zhang | Shenglei Zhao | Xiangdong Li | Yunlong He | Haiqing Jiang | Weihang Zhang | Zhenxing Guo | Y. Zou | Jiang Renyuan