论文信息 - Some considerations of selected area channelling in the scanning electron microscope

Some considerations of selected area channelling in the scanning electron microscope

Several methods are reviewed for generating electron channelling patterns from small selected areas on bulk specimens in the scanning electron microscope. Procedures are given for indexing patterns, and it is shown that Kikuchi maps can be used for this purpose. To illustrate one possible application, the crystallographic misorientation across a low-angle boundary is determined.

E. Schulson | Erland M. Schulson

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